Bruker AXS SE
Booth number: P11/I
www.bruker.com/baxs
About us
Bruker AXS is a global market and technology leader for structural analysis with X-ray and electron diffraction and elemental analysis using X-ray fluorescence, spark optical emission spectroscopy, and CS/ONH analysis. Bruker AXS provides advanced solutions in X-ray and electron microscopy. We enable customers across various industries and research fields to enhance their productivity and achieve technological breakthroughs with our innovative analytical solutions.
Bruker AXS solutions emphasize high performance, flexibility, and ease-of-use. We offer a broad selection of sources, optics, sample environments, and detectors, along with expert advice for optimal configuration. We build robust and compact instruments for harsh, industrial environments and support our customers with professional training and worldwide service.
Address
Oestliche Rheinbrueckenstr. 49
76187 Karlsruhe
Germany
E-mail: info.baxs@bruker.com
Phone: +49 721 50997-0
Internet: www.bruker.com/baxs
30 Biopolis Street
#09-01 Matrix
138671 Singapore
Singapore
E-mail: sales.sg@bruker.com
Phone: +65 65404388
Internet: www.bruker.com/baxs
Contact person:
Marcom Manager Shermain Kim
E-mail: shermain.kim@bruker.com
S6 JAGUAR: Full WDXRF on a Bench
From table ware and construction materials, from industry refractory materials to high performance ceramics in electronics, non-metallic oxide materials have a wide usage. The performance of a furnace lining or a ceramic insulator strongly depends on the elemental composition. The S6 JAGUAR with GEO-QUANT Basic analyzes raw materials, intermediates and final products. It can handle different sample sizes with the changeable collimator mask and is therefore a excellent tool even for final products.
S8 TIGER Series 2 WDXRF: Flexible and Powerful Process and Quality Control
Elemental Analysis at its best with WDXRF S8 TIGER Series 2 for flexible and powerful process and quality control
D6 PHASER: The Powerful, Versatile and Accessible XRD Platform
The world's first benchtop platform for X-ray powder diffraction in reflection and transmission geometry, thin film analysis by grazing incidence diffraction and reflectometry, and bulk sample stress and texture analysis.
